TFP-01,Test Finger Probe (IEC试验指)
TFP-01,Test Finger Probe (IEC试验指),符合: IEC, EN,CSA,UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(关节试验指),符合UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(UL关节试验指)
TFP-01,Test Finger Probe (IEC试验指),符合: IEC, EN,CSA,UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(关节试验指),符合UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(UL关节试验指)
Model TFP-01: Test Finger Probe(IEC试验指)
| This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements - with integral palm simulator. This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IEC CB Scheme. Finger made of chrome plated steel. All parts precision machined. |
美国.ED&D产品服务于:IBM ，美国航空暨太空总署，英代尔，苹果， NCR ，索尼公司，太阳，飞利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托罗拉， Mattel ，戴尔,3 Com 等公司;专为UL ， CSA ， ETL ， TUV,Demko等试验室提供检测产品.
TFP-01,Test Finger Probe (IEC试验指)
IEC试验指
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