SP-01,Scratch Pin Probe 乱写探针
SP-01,Scratch Pin Probe 乱写探针,基于IEC标准,适用表面绝缘层的磨擦试验,品牌:美国.ED&D
| OTHER SAFETY PRODUCTS 其它**测试 |
| SP-01,Scratch Pin Probe 乱写探针 |
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Used to test resistance to abrasion on insulating materials and conformal coatings. Hardened steel pin, the end is a cone having a top angle of 40 degrees, tip is rounded with a radius of 0.25 ± 0.02 mm. Complies with many Standards, including IEC based Standards. Entire scratch test apparatus available. |
美国.ED&D产品服务于:IBM ，美国航空暨太空总署，英代尔，苹果， NCR ，索尼公司，太阳，飞利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托罗拉， Mattel ，戴尔,3 Com 等公司;专为UL ， CSA ， ETL ， TUV,Demko等试验室提供检测产品.
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SP-01,Scratch Pin Probe 乱写探针
SP-01,Scratch Pin Probe 乱写探针
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